Three-dimensional X-FEM modeling of crack coalescence phenomena in the Smart Cut<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si3.svg" display="inline" id="d1e750"><mml:msup><mml:mrow /><mml:mrow><mml:mtext>TM</mml:mtext></mml:mrow></mml:msup></mml:math> technology-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Three-dimensional X-FEM modeling of crack coalescence phenomena in the Smart CutTM technology

Published:2023-01 Issue: Volume:213 Page:103839
ISSN:0168-874X
Container-title:Finite Elements in Analysis and Design
language:en
Short-container-title:Finite Elements in Analysis and Design

Author:

Pali E.^ORCID,Gravouil A.,Tanguy A.,Landru D.,Kononchuk O.

Publisher

Elsevier BV

Subject

Applied Mathematics,Computer Graphics and Computer-Aided Design,General Engineering,Analysis

Reference88 articles.

1. In situ observation of pressurized microcrack growth in silicon;Colonel;Phys. Status Solidi A,2021

2. Cracks and blisters formed close to a silicon wafer surface by He-H co-implantation at low energy;Cherkashin;J. Appl. Phys.,2015

3. Impact of He and H relative depth distributions on the result of sequential He+ and H+ ion implantation and annealing in silicon;Cherkashin;J. Appl. Phys.,2018

4. A method to determine the pressure and densities of gas stored in blisters: Application to H and He sequential ion implantation in silicon;Daghbouj;Microelectron. Eng.,2018

5. Fracture dynamics in implanted silicon;Massy;Appl. Phys. Lett.,2015

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Integration of Polynomials Times Double Step Function in Quadrilateral Domains for XFEM Analysis;Algorithms;2023-06-04

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP