Electrical characterization of MFeOS gate stacks for ferroelectric FETs-Reference-Cited by-同舟云学术

Electrical characterization of MFeOS gate stacks for ferroelectric FETs

Published:2013-12 Issue:6 Volume:16 Page:1603-1607
ISSN:1369-8001
Container-title:Materials Science in Semiconductor Processing
language:en
Short-container-title:Materials Science in Semiconductor Processing

Author:

Kumar Atul,Rao Ashwath,Goswami Manish,Singh B.R.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

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