Thin film characterization by total reflection x-ray fluorescence

Author:

Danel Adrien,Nolot Emmanuel,Veillerot Marc,Olivier Ségolène,Decorps Tifenn,Calvo-Muñoz Maria-Luisa,Hartmann Jean-Michel,Lhostis Sandrine,Kohno Hiroshi,Yamagami Motoyuki,Geoffroy Charles

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Reference14 articles.

1. International Technology Roadmap for Semiconductor, http://public.itrs.net, 2007 revision.

2. See the Proceedings of the 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Gaithersburg, March 2007, MD, USA. American Institute of Physics proceedings, vol. 931 (2007).

3. Whole surface analysis of semiconductor wafers by accumulating short-time mapping data of total-reflection x-ray fluorescence spectrometry;Mori;Anal. Chem.,2002

4. Characterization of high-k gate dielectric and metal gate electrode semiconductor samples with a total reflection x-ray fluorescence spectrometer;Sparks;Spectrochem. Acta,2004

5. Thin films characterization by ultra trace metrology;Danel;Am. Inst. Phys. Proc.,2007

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. X-ray fluorescence analysis of solid-state films, layers, and coatings;Radiation Physics and Chemistry;2022-08

2. Pulsed chemical vapor deposition of conformal GeSe for application as an OTS selector;Materials Advances;2021

3. Total-Reflection X-Ray Fluorescence (TXRF) Analysis;Surface and Thin Film Analysis;2011-04-12

4. Novel Analytical Methods for Cleaning Evaluation;Handbook of Cleaning in Semiconductor Manufacturing;2011-02-22

5. X-ray Spectrometry;Analytical Chemistry;2010-05-24

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3