Nucleation and phase formation during reactive magnetron co-sputtering of Cu(In,Ga)S2 films, investigated by in situ EDXRD
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference31 articles.
1. Experimental considerations for in situ X-ray scattering analysis of OMVPE growth;Brennan;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment,1990
2. A miniature X-ray compatible sputtering system for studying insitu high-Tc thin-film growth;Zheng;Journal of Vacuum Science & Technology A—Vacuum Surfaces and Films,1991
3. In situ investigation by energy dispersive X-ray diffraction (EDXRD) of the growth of magnetron sputtered ITO films;Ellmer;Surface and Coatings Technology,2001
4. Setup for in situ X-ray diffraction studies of thin film growth by magnetron sputtering;Ellmer;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment,2001
5. Reactive magnetron sputtering of molybdenum sulfide thin films: in situ synchrotron x-ray diffraction and transmission electron microscopy study;Weiss;Journal of Applied Physics,2004
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