In-situ X-ray diffraction annealing study of electroplated and sputtered Cu-In-Ga precursors for application to sequential Cu(In,Ga)Se2 processes-Reference-Cited by-同舟云学术

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In-situ X-ray diffraction annealing study of electroplated and sputtered Cu-In-Ga precursors for application to sequential Cu(In,Ga)Se2 processes

Published:2022-09 Issue: Volume:758 Page:139399
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Aninat R.,Hovestad A.,van Zelst F.,van den Bruele F.J.^ORCID,Schermer J.J.,Emmelkamp J.,Vlieg E.^ORCID,Linden H.,Theelen M.^ORCID

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference34 articles.

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3. Improvement of electrical yield in the fabrication of CIGS-based thin-film modules;Kushiya;Thin. Solid. Films,2001

4. New technologies for CIGS photovoltaics;Delahoy;Sol. Energy,2004

5. Single source precursors for fabrication of I–III–VI2 thin-film solar cells via spray CVD;Hollingsworth;Thin. Solid. Films,2003

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1. Modelling approach applied to SnIn coatings from choline chloride/ethylene glycol deep eutectic solvent;Journal of Molecular Liquids;2023-11

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