1. IEEE TC-10, IEEE Std 1241-2001, Standard for Terminology and Test Methods for Analog-to-Digital Converters.
2. IEEE TC-10, IEEE Std 1057-94—IEEE Standard for Digitizing Wave-form Recorders.
3. Improving convergence of sine fitting algorithms;Fonseca da Silva,2001
4. Standard environment for the sine wave test of ADC's;Márkus;Measurement Journal of IMEKO,2002
5. Fast and accurate ADC testing via an enhanced sine wave fitting algorithm;Giaquinto;IEEE Transactions on Instrumentation and Measurement,1997