1. IEEE Standard 1057, IEEE Standard for Digitizing Waveform Recorders, IEEE, Piscataway, NJ, USA, December 1994.
2. IEEE Draft Standard 1241, IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters, IEEE, Piscataway, NJ, USA, May 1999.
3. IMEKO TC4 Working Group on A/D and D/A Converter Metrology and EUPAS (European Project for ADC-based Devices Standardisation), URL: http://elve.le.ttu.ee/MESEL_www_home/R&D/ADC/EUPAS.htm, http://remlab.dis.unina.it/Vpages/ADCWG.htm
4. I. Kollár, Evaluation of sine wave tests of ADC’s from Windowed Data, Computer Standards Interfaces, Vol. 22, pp. 261-268,2000.
5. DYNAD, URL: http://www.fe.up.pt/~hsm/dynad/