Fast and accurate ADC testing via an enhanced sine wave fitting algorithm
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Link
http://xplorestaging.ieee.org/ielx3/19/14201/00650820.pdf?arnumber=650820
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4. An Improved Sine Wave Histogram Test Method for ADC Characterization;IEEE Transactions on Instrumentation and Measurement;2019-10
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