Author:
Shinde N.,Morita K.,Dhole S.D.,Ishikawa D.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Auger electron emission from a Si(111) surface during 11-keV Ar+ ion sputtering;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2013-11
2. Ionization probability of secondary ions sputtered from Si(111) and Ge(111) surfaces;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2011-02
3. Effect of residual oxygen on ionization processes of Si+ and Si2+ sputtered from Si(111)-7×7 surface;Applied Surface Science;2008-12
4. Effect of residual oxygen in Si(111)-7×7 surface on Si+ and Si2+ sputter yields;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-05