Investigation of the surface preparation of GaAs substrates for MBE and VPE with whole sample optical reflection
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference19 articles.
1. Defects in Semiconductors;Miyazawa,1986
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3. Characterization of GaAs wafers and epilayers with electron‐beam‐induced current, etching, and reflected light
4. Distributions of residual stress, dislocations, and EL2 in Czochralski‐grown semi‐insulating GaAs
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