Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference7 articles.
1. Proc. Third Internat. Symp. Defect Recognition and Image Processing in III-V Compounds (DRIP III), Ed. T. Owaga, J. Cryst. Growth 103, No. 1-4 (1990).
2. Proc. Fourth Internat. Conf. Defect Recognition in Semiconductors before and after Processing (DRIP IV), Eds. M. R. Brozel and D. J. Stirland, Semicond. Sci. Technol. 7, No. 1A (1992).
3. Comparison of surface polishing techniques used for InP wafers
4. Investigation of the surface preparation of GaAs substrates for MBE and VPE with whole sample optical reflection
5. Experimental confirmation of the peculiar behaviour of the coherent-type twin boundaries in sphalerite crystals
Cited by
11 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献