1. Intrinsic Gettering in Nitrogen-Doped and Hydrogen-Annealed Czochralski-Grown Silicon Wafers
2. Sueoka K, Akatsuka M, Yonemura M, Ono T, Eiichi Asayama, Koike Y, Sadamitsu S, GADEST 2001 on Solid State Phenomena, vol. 82–84, 2002. p. 49.
3. The impact of nitrogen on the defect aggregation in silicon
4. Karoui A, Karouri FS, Rozgonyi GA, Hourai M, Sueoka K. Semiconductor Silicon 2002, ECS Proceedings, vol. 2002-2, 2002. p. 670.
5. Müller T, Siebert W, Messmann K, Walich R, Krottenthaler P, Hölz R, Ikari A, Ammon Wv, Semiconductor Silicon 2002, ECS Proceedings, vol. 2002-2, 2002. p. 194.