Analysis of performance for novel pocket-doped NCFET under the influence of interface trap charges and temperature variation

Author:

Malvika ORCID,Choudhuri Bijit,Mummaneni Kavicharan

Funder

National Institute of Technology, Silchar

Publisher

Elsevier BV

Subject

General Engineering

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5. A novel extended source TFET with δp+- SiGe layer;Talukdar;Sil,2020

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