STM and AFM observations of damage produced by swift Ne and Kr ions in graphite
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Radiation
Reference6 articles.
1. Scanning Tunneling Microscopy Study Of Single-ion Impacts on Graphite Surface;Porte;Nucl. Instr. Methods Phys. Res. Sect. B,1989
2. Atomic Force Microscopy Observations of Swift Heavy Ion Irradiated Surfaces;Bouffard;Radiat. Eff. and Defects in Solids,1993
3. Atomic-Force-Microscopy Observations of Tracks Induced by Swift Kr Ions in Mica;Thibaudau;Phys. Rev. Lett.,1991
4. Scanning-tunneling-microscope investigation of a 215-MeV Ne-irradiated graphite surface;Biró;Phys. Rev. B,1995
5. Atomic scale investigation of surface modification induced by 215 MeV Ne irradiation on graphite;Biró;Nucl. Instr. and Methods B,1995
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Comparative study of irradiation effects in graphite and graphene induced by swift heavy ions and highly charged ions;Carbon;2016-04
2. Production of sp3 hybridization by swift heavy ion irradiation of HOPG;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2013-07
3. AFM observations of latent fission tracks on surfaces: amorphous SiO2 and quartz;Radiation Measurements;2003-06
4. Slow and fast positron studies of defects created in silicon by swift Kr ions;Applied Surface Science;1999-08
5. High resolution imaging for charged particles using CR-39 and atomic force microscopy;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1999-02
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3