Atomic-force-microscopy observations of tracks induced by swift Kr ions in mica
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.67.1582/fulltext
Reference13 articles.
1. Surface morphology of oxidized and ion‐etched silicon by scanning tunneling microscopy
2. Scanning tunneling microscopy of defects induced by carbon bombardment on graphite surfaces
3. Damage processes and magnetic field orientation in ferrimagnetic oxidesY3Fe5O12andBaFe12O19irradiated by high-energy heavy ions: A Mössbauer study
4. Comparison of the radii of latent tracks induced by high-energy heavy ions in Y3Fe5O12by HREM, channelling Rutherford backscattering and Mössbauer spectrometry
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