High resolution imaging for charged particles using CR-39 and atomic force microscopy-Reference-Cited by-同舟云学术

High resolution imaging for charged particles using CR-39 and atomic force microscopy

Published:1999-02 Issue:1-3 Volume:422 Page:751-755
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Takahashi H,Amemiya K,Kaizuka Y,Nakazawa M,Yasuda N,Yamamoto M,Sakai T,Kamiya T,Okada S

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference5 articles.

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

2. Soft X-ray imaging using CR-39 plastics with AFM readout;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-03

4. Ultra-high resolution radiography using CR-39 solid state track detectors and atomic force microscopy;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-10