STM and AFM observations of latent tracks
Author:
Affiliation:
1. a CIRIL , rue Claude Bloch, BP 5133, F-14040, Caen, Cedex, France
2. b SRSIM , CEN-Saclay, F-91191, Gif sur Yvette, France
Publisher
Informa UK Limited
Subject
Condensed Matter Physics,General Materials Science,Nuclear and High Energy Physics,Radiation
Link
https://www.tandfonline.com/doi/pdf/10.1080/10420159308219714
Reference6 articles.
1. Scanning tunneling microscopy of defects induced by carbon bombardment on graphite surfaces
2. Scanning tunneling microscopy observation of local damages induced on graphite surface by ion implantation
3. A simple wave function interference model for the electron-density superstructures observed during scanning tunneling microscopy of perturbed graphite surfaces
4. Investigation of heavy ion produced defect structures in insulators by small angle scattering
5. Atomic-force-microscopy observations of tracks induced by swift Kr ions in mica
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