Pulsed laser deposition of HfO2 thin films on indium zinc oxide: Band offsets measurements
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
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1. Development of UHV pulsed laser deposition set-up for in-situ photoelectron spectroscopic study at ARPES beamline, Indus-1 synchrotron radiation source, India;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2021-01
2. Modeling drain current of indium zinc oxide thin film transistors prepared by solution deposition technique;Solid-State Electronics;2018-06
3. Extraction method of trap densities for indium zinc oxide thin-film transistors processed by solution method;Thin Solid Films;2018-03
4. Temporal and voltage stress stability of high performance indium-zinc-oxide thin film transistors;Solid-State Electronics;2017-10
5. The Effect of Nb Incorporation on the Electronic Properties of Anodic HfO2;ECS Journal of Solid State Science and Technology;2017
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