Structural, morphological and electrical properties of nickel oxide thin films deposited by reactive sputtering-Reference-Cited by-同舟云学术

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Structural, morphological and electrical properties of nickel oxide thin films deposited by reactive sputtering

Published:2015-12 Issue: Volume:357 Page:838-844
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Keraudy J.,García Molleja J.,Ferrec A.,Corraze B.,Richard-Plouet M.,Goullet A.,Jouan P.-Y.

Funder

Institute of Research and Technology – Jules Vernes and Région Pays de la Loire

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference39 articles.

1. p-Type semiconducting nickel oxide as an efficiency-enhancing anode interfacial layer in polymer bulk-heterojunction solar cells

2. Electrical Manipulation of Nanofilaments in Transition-Metal Oxides for Resistance-Based Memory

3. Disproportionation and comproportionation reactions of resistive switching in polycrystalline NiOx films

4. Switching of nanosized filaments in NiO by conductive atomic force microscopy

5. Sensing characteristics of NiO thin films as NO2 gas sensor

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1. One‐Step Synthesis and Deposition of Metal Oxides: NiO Quantum Dots as a Transport Layer for Perovskite Photovoltaics;Advanced Engineering Materials;2024-05-09

2. Effect of sputtering pressure and oxygen content on the electrochromic properties of NiO films by DC magnetron sputtering;Physica B: Condensed Matter;2024-03

3. Control of microstructure and composition of reactively sputtered vanadium nitride thin films based on hysteresis curves and application to microsupercapacitors;Journal of Vacuum Science & Technology A;2024-01-17

4. Effect of RF power on structural, optical and electrical properties of sputtered nickel oxide;Physica B: Condensed Matter;2023-06

5. Blue emission of nano-crystalline NiO0.96 thin films doped with metallic copper;Indian Journal of Physics;2023-01-04

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