Schottky barrier detectors based on high quality 4H-SiC semiconductor: Electrical and detection properties-Reference-Cited by-同舟云学术

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Schottky barrier detectors based on high quality 4H-SiC semiconductor: Electrical and detection properties

Published:2018-12 Issue: Volume:461 Page:276-280
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Zaťko B.,Hrubčín L.,Šagátová A.,Osvald J.,Boháček P.,Zápražný Z.,Sedlačková K.,Sekáčová M.,Dubecký F.,Skuratov V.A.,Korytár D.,Nečas V.

Funder

Slovak Grant Agency for Scienc

Slovak Research and Development Agency

Project Research and Development Centre for Advanced X-ray Technologies

European Regional Development Fund

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference30 articles.

1. Investigation of Ni/4H-SiC diodes as radiation detectors with low doped n-type 4H-SiC epilayers

2. Contact resistance measurements onp‐type 6H‐SiC

3. Possibility of Subelectron Noise With Room-Temperature Silicon Carbide Pixel Detectors

4. A new generation of X-ray detectors based on silicon carbide

5. Silicon carbide for high resolution X-ray detectors operating up to 100°C

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1. Preparation and mechanical performance of 3D printed Cf/SiC laminated ceramics;Ceramics International;2024-09

2. Electrical properties study of the 4H-SiC detectors based on thick epitaxial layer;AIP Conference Proceedings;2024

3. High-resolution alpha-particle detector based on Schottky barrier 4H-SiC detector operated at elevated temperatures up to 500 °C;Applied Surface Science;2023-10

4. Large-area vertical Schottky barrier diodes based on 4H-SiC epilayers: Temperature-dependent electrical characteristics;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2023-03

5. Effect of Electron Irradiation on Spectroscopic Properties of Schottky Barrier CdTe Semiconductor Detectors;High-Z Materials for X-ray Detection;2023

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