Contact resistance measurements onp‐type 6H‐SiC
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.108964
Reference11 articles.
1. Single‐crystalline, epitaxial cubic SiC films grown on (100) Si at 750 °C by chemical vapor deposition
2. Electrical Contacts to Beta Silicon Carbide Thin Films
3. Ohmic Contacts on β-SiC
4. Effect of the junction interface properties on blue emission of SiC blue LEDs grown by step-controlled CVD
5. Field and thermionic-field emission in Schottky barriers
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