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Experimental setup for Single Event Effects at the São Paulo 8UD Pelletron Accelerator

  • Published:2014-08 Issue: Volume:332 Page:397-400
  • ISSN:0168-583X
  • Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
  • language:en
  • Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Aguiar V.A.P.,Added N.,Medina N.H.,Macchione E.L.A.,Tabacniks M.H.,Aguirre F.R.,Silveira M.A.G.,Santos R.B.B.,Seixas L.E.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference15 articles.

1. Radiation effects on electronic devices in space;Duzellier;Aerosp. Sci. Technol.,2005

2. Performance of electronic devices submitted to X-rays and high energy proton beams;Silveira;Nucl. Instr. Meth. Phys. Res., Sect. B,2012

3. ESA/SCC Basic specification No. 25100: Single event effects test method and guidelines,1995

4. Low energy proton-induced single-event-upsets in 65nm node, Silicon-on-Insulator, latches and memory cells;Rodbell;IEEE Trans. Nucl. Sci.,2007

5. Radiation-induced soft errors in advanced semiconductor technologies;Baumann;IEEE Trans. Device Mater. Reliab.,2005

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