Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
30 articles.
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1. Analyzing Aging Effects on SRAM PUFs: Implications for Security and Reliability;Journal of Hardware and Systems Security;2024-07-27
2. Combining Fault Simulation and Beam Data for CNN Error Rate Estimation on RISC-V Commercial Platforms;2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS);2024-07-03
3. A New Reliability Analysis of RISC-V Soft Processor for Safety-Critical Systems;2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS);2024-04-03
4. Non-intrusive study on FPGA of the SEU sensitivity on the COTS RISC-V VeeR EH1 soft processor from Western Digital;Microprocessors and Microsystems;2024-03
5. A radiation hard RISC-V microprocessor for high-energy physics applications;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2023-11