Author:
Olivero P.,Forneris J.,Gamarra P.,Jakšić M.,Giudice A. Lo,Manfredotti C.,Pastuović Ž.,Skukan N.,Vittone E.
Funder
Accademia Nazionale dei Lincei – Compagnia di San Paolo
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
5 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. 4H-SiC Schottky diode radiation hardness assessment by IBIC microscopy;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2023-04
2. A Monte Carlo software for the 1-dimensional simulation of IBIC experiments;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2014-08
3. Modeling of ion beam induced charge sharing experiments for the design of high resolution position sensitive detectors;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2013-07
4. Semiconductor Characterization by Scanning Ion Beam Induced Charge (IBIC) Microscopy;ISRN Materials Science;2013-01-17
5. Radiation Effects Microscopy;Characterization of Materials;2012-10-12