Semiconductor characterization by scanning ion beam induced charge (IBIC) microscopy
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference20 articles.
1. Zum Mechanismus des lichtelektrischen Prim�rstromes in isolierenden Kristallen
2. Materials Analysis Using a Nuclear Microprobe;Breese,1996
3. A review of ion beam induced charge microscopy
4. Currents Induced by Electron Motion
5. Theory of ion beam induced charge collection in detectors based on the extended Shockley–Ramo theorem
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