Modeling of ion beam induced charge sharing experiments for the design of high resolution position sensitive detectors
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference18 articles.
1. Currents to Conductors Induced by a Moving Point Charge
2. Charge sharing in multi-electrode devices for deterministic doping studied by IBIC
3. Monte Carlo analysis of a lateral IBIC experiment on a 4H-SiC Schottky diode
4. A review of ion beam induced charge microscopy
5. Probability of divacancy trap production in silicon diodes exposed to focused ion beam irradiation
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. An ion beam spot size monitor based on a nano-machined Si photodiode probed by means of the ion beam induced charge technique;Vacuum;2022-11
2. Ion Beam Induced Charge analysis of diamond diodes;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-08
3. A Monte Carlo software for the 1-dimensional simulation of IBIC experiments;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2014-08
4. Measurement and modelling of anomalous polarity pulses in a multi-electrode diamond detector;EPL (Europhysics Letters);2013-10-01
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