Author:
Gotszalk Teodor,Grabiec Piotr,Rangelow Ivo W.
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference23 articles.
1. Atomic Force Microscope
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3. I.W. Rangelow, Deep Etching of Silicon, Politechnika, 1996, ISBN83-7085-254-8.
4. M. Tortonese, H. Yamada, R.C. Barett, C.F. Quate, IEEE, 91CH2817-5, 1991, p. 448.
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