Atomic force microscopy using a piezoresistive cantilever-Reference-Cited by-同舟云学术

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Atomic force microscopy using a piezoresistive cantilever

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Container-title:TRANSDUCERS '91: 1991 International Conference on Solid-State Sensors and Actuators. Digest of Technical Papers
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Author:

Tortonese M.,Yamada H.,Barrett R.C.,Quate C.F.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx2/505/3940/00148908.pdf?arnumber=148908

Cited by 75 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A polymer–semiconductor–ceramic cantilever for high-sensitivity fluid-compatible microelectromechanical systems;Nature Electronics;2024-07-15

2. Construction of a cryogenic dual scanner magnetic force microscope equipped with piezoresistive cantilever;Review of Scientific Instruments;2024-07-01

3. Development of in-situ SEM testing apparatus for observing behavior of material at high magnification during tensile test;Measurement;2023-11

4. Multipurpose active scanning probe cantilevers for near-field spectroscopy, scanning tunnel imaging, and atomic-resolution lithography;Journal of Vacuum Science & Technology B;2023-06-06

5. Atomic Force Microscope with an Adjustable Probe Direction and Integrated Sensing and Actuation;Nanomanufacturing and Metrology;2022-06

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