Atomic force microscopy using a piezoresistive cantilever
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx2/505/3940/00148908.pdf?arnumber=148908
Cited by 75 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. A polymer–semiconductor–ceramic cantilever for high-sensitivity fluid-compatible microelectromechanical systems;Nature Electronics;2024-07-15
2. Construction of a cryogenic dual scanner magnetic force microscope equipped with piezoresistive cantilever;Review of Scientific Instruments;2024-07-01
3. Development of in-situ SEM testing apparatus for observing behavior of material at high magnification during tensile test;Measurement;2023-11
4. Multipurpose active scanning probe cantilevers for near-field spectroscopy, scanning tunnel imaging, and atomic-resolution lithography;Journal of Vacuum Science & Technology B;2023-06-06
5. Atomic Force Microscope with an Adjustable Probe Direction and Integrated Sensing and Actuation;Nanomanufacturing and Metrology;2022-06
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