An availability calculation for k-out-of-N redundant system with common-cause failures and replacement

Author:

Chung Who Kee

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference7 articles.

1. A 4-unit redundant system with common-cause failures;Dhillon;IEEE Trans. Reliab.,1977

2. A 4-unit redundant system with common-cause failures;Dhillon;IEEE Trans. Reliab.,1979

3. A common-cause failure availability model;Dhillon;Microelectron. Reliab.,1978

4. A k-out-of-N three-state devices system with common-cause failures;Dhillon;Microelectron. Reliab.,1978

5. Common-cause outages in multiple circuit transmission lines;Billinton;IEEE Trans. Reliab.,1978

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1. An approximation method for evaluating the reliability of a dynamic k-out-of-n:F system subjected to cyclic alternating operation conditions;Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability;2017-01-30

2. Dynamic k-out-of-n system reliability with component partnership;Reliability Engineering & System Safety;2015-06

3. Systems with two dual failure modes — A survey;Microelectronics Reliability;1993-08

4. Linear system reliability with common-mode forced outages;Reliability Engineering & System Safety;1993-01

5. Reliability of a system with common-mode outages;Reliability Engineering & System Safety;1993-01

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