A k-out-of-n three-state devices system with common-cause failures-Reference-Cited by-同舟云学术

A k-out-of-n three-state devices system with common-cause failures

Published:1978-01 Issue:5 Volume:18 Page:447-448
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Dhillon Balbir S.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference4 articles.

1. Literature survey on three-state device reliability systems;Dhillon;Microelectron. Reliab.,1977

2. Optimal maintenance policy for system with common-cause failures;Dhillon,1978

3. A 4-unit redundant system with common-cause failures;Dhillon;IEEE Trans. Reliab.,1977

4. Reactor Safety Study,1975

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