A common cause failure availability model-Reference-Cited by-同舟云学术

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A common cause failure availability model

Published:1978-01 Issue:6 Volume:17 Page:583-584
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Dhillon Balbir S.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference9 articles.

1. U.S.A.E.C. Report,1974

2. Common mode failure analysis is ‘in’;Gangloff;Electl Wld,1972

3. Common mode failure analysis;Gangloff;IEEE Trans. Power Apparatus, Systems,1975

4. Common mode failure considerations in the design of systems for protection and control;Epler;Nucl. Safety,1969

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Common-cause failure analysis of a parallel system with warm standby;Microelectronics Reliability;1993-07

2. Common-cause failure analysis of a non-identical unit parallel system with arbitrarily distributed repair times;Microelectronics Reliability;1993-01

3. Reliability analysis of a non-identical unit parallel system with common-cause failures;Microelectronics Reliability;1991-01

4. On common-cause failures—Bibliography;Microelectronics Reliability;1990-01

5. Analysis Of Systems With Human Errors And Common-Cause Failures;International Journal of Modelling and Simulation;1989-01

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