A 4-Unit Redundant System with Common-Cause Failures
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Link
http://xplorestaging.ieee.org/ielx5/24/5220554/05220588.pdf?arnumber=5220588
Cited by 18 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Maintenance Optimization of Two-units System with General Time Distributions;2018
2. Systems with two dual failure modes — A survey;Microelectronics Reliability;1993-08
3. Common-cause failure analysis of a parallel system with warm standby;Microelectronics Reliability;1993-07
4. Common-cause failure analysis of a non-identical unit parallel system with arbitrarily distributed repair times;Microelectronics Reliability;1993-01
5. Reliability analysis of a non-identical unit parallel system with common-cause failures;Microelectronics Reliability;1991-01
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