Author:
Scherge M.,Breternitz V.,Knedlik Ch.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference7 articles.
1. Grundlagen der Elektrodiffusion;Schreiber;VDI,1985
2. A simulation model for electromigration behaviour;Harrison;IEEE Trans. Electron. Devices,1988
3. Electromigration, Stresses;Koleshko;Phys. Stat. Solidi (a),1990
4. Current induced marker motion in gold wires;Huntington;J. Phys. Chem. Solids,1961
5. A model for electromigration;Ross;Scripta Metall.,1987
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献