Author:
Berberich S,Godignon P,Morvan E,Fonseca L,Millán J,Hartnagel H.L
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
3 articles.
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1. Atomic-Resolution Study of β-Si3N4/SiO2 Interfaces;Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces;2011
2. Silicon Nitride Ceramics;Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces;2011
3. Experimental analysis of I‐V and C‐V characteristics of Ni/SiO2/4H‐SiC system with varying oxide thickness;Microelectronics International;2010-05-11