Experimental analysis of I‐V and C‐V characteristics of Ni/SiO2/4H‐SiC system with varying oxide thickness
Author:
Gupta Sanjeev K.,Azam A.,Akhtar J.
Abstract
PurposeThe purpose of this paper is to electrically examine the quality of thin thermally grown SiO2 with thickness variation, on Si‐face of 4H‐SiC <0001> (having 50 μm epitaxial layer) by current‐voltage (I‐V) and capacitance‐voltage (C‐V) methods.Design/methodology/approachMetal‐oxide‐silicon carbide (MOSiC) structures with varying oxide thickness have been fabricated on device grade 4H‐SiC substrate. Ni has been used for gate metal on thermally oxidized Si‐face and a composite layer of Ti‐Au has been used for Ohmic contact on the highly doped C‐face of the substrate. Each structure was diced and bonded on a TO‐8 header with a suitable wire bonding for further testing using in‐house developed LabVIEW‐based computer aided measurement setup.FindingsThe leakage current of fabricated structures shows an asymmetric behavior with the polarity of gate bias ( + V or −V at the anode). A strong relation of oxide thickness and temperature on effective barrier height at SiO2/4H‐SiC interface as well as on oxide charges have been established and reported in this paper.Originality/valueThe paper focuses on the development of 4H‐SiC based device technology in the fabrication of MOSiC‐based integrated structures.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference37 articles.
1. Afanas'ev, V.V., Bassler, M., Pensl, G., Schultz, M.J. and Kamienski, E.S. (1996), “Band offsets and electronics structure of SiC/SiO2 interface”, J. Appl. Phys., Vol. 79, pp. 3108‐12. 2. Akhtar, J., Deshwal, V.P., Pradhan, N., Gupta, S.K., Bagchi, A.K., Soni, R.N., Bhatia, R.R., Negi, G.S., Sharma, A.K., Gupta, A.K., Pathak, B.C., Joshi, B.C., Dube, A.K., Lal, B., Lal, H., Kak, R. and Rathore, M.S. (2007), “Design and fabrication of 4H‐SiC Schottky diode detector”, Technical Report, CEERI/MTG/2007/1, CEERI, Pilani. 3. Allerstam, F., Olafsson, H.O., Gudjonsson, G., Dochev, D., Sveinbjornsson, E.O., Rodle, T. and Jos, R. (2007), “A strong reduction in the density of near‐interface traps at the SiO2/4H‐SiC interface by sodium enhanced oxidation”, J. Appl. Phys., Vol. 101, p. 124502. 4. Avice, M., Grossner, U., Pintilie, I., Svensson, B.G., Nilsen, O. and Fjellvag, H. (2006), “Comparison of near‐interface traps in Al2O3/4H‐SiC and Al2O3/SiO2/4H‐SiC structures”, Appl. Phys. Lett., Vol. 89, p. 222103. 5. Berberich, S., Godignon, P., Morvan, E., Fonseca, L., Millan, J. and Hartnage, H.L. (2000), “Electrical characterization of Si3N4/SiO2 double layers on p‐type 6H‐SiC”, Microelectron. Reliab., Vol. 40, pp. 833‐6.
Cited by
9 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
|
|