Mapping the strain distribution within embedded nanoparticles via geometrical phase analysis-Reference-Cited by-同舟云学术

Mapping the strain distribution within embedded nanoparticles via geometrical phase analysis

Published:2019-10 Issue: Volume:125 Page:102715
ISSN:0968-4328
Container-title:Micron
language:en
Short-container-title:Micron

Author:

Wang Yan,Zhang Wei

Funder

National Natural Science Foundation of China

Development of Science and Technology of Jilin Province

Open Project Program of Wuhan National Laboratory for Optoelectronics

Jilin Province/Jilin University co-Construction Project-Funds for New Materials

Program for JLU Science and Technology Innovative Research Team

Fundamental Research Funds for the Central Universities JLU, and “Double-First Class” Discipline for Materials Science & Engineering

Publisher

Elsevier BV

Subject

Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science

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4. Lattice distortion analysis directly from high resolution transmission electron microscopy images-the LADIA program package;Du;J. Mater. Sci. Technol.,2002

5. The Peak Pairs algorithm for strain mapping from HRTEM images;Galindo;Ultramicroscopy,2007

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