Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference38 articles.
1. Measurement of the lattice misfit in the single crystal nickel based superalloys CMSX-4, SRR99 and SC16 by convergent beam electron diffraction
2. Deformation Structures of Pure Titanium during Shear Deformation
3. Non-destructive determination of local strain with 100-nanometre spatial resolution
4. Strain determination in silicon microstructures by combined convergent beam electron diffraction, process simulation, and micro-Raman spectroscopy
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