Elastic strain mapping of plastically deformed materials by TEM-Reference-Cited by-同舟云学术

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Elastic strain mapping of plastically deformed materials by TEM

Published:2024-11 Issue: Volume:265 Page:114010
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Després Arthur^ORCID,Parent Salomé,Véron Muriel,Rauch Edgar F.,Joulain Anne,Bahsoun Hadi,Tromas Christophe

Publisher

Elsevier BV

Reference42 articles.

1. Automated High Precision Strain Measurement Using Nanobeam Diffraction Coupled with Precession;Darbal;Microsc. Microanal.,2013

2. Improved strain precision with high spatial resolution using nanobeam precession electron diffraction;Rouviere;Appl. Phys. Lett.,2013

3. Measurement of the displacement field of dislocations to 0.03 Å by electron microscopy;Hÿtch;Nature,2003

4. Nanoscale holographic interferometry for strain measurements in electronic devices;Hÿtch;Nature,2008

5. Nanoscale elastic strain mapping of polycrystalline materials;Rottmann;Mater. Res. Lett.,2018

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