Author:
Hÿtch Martin J.,Putaux Jean-Luc,Pénisson Jean-Michel
Publisher
Springer Science and Business Media LLC
Reference18 articles.
1. Nabarro, F. R. N. (ed.) Dislocations in Solids Vols 1–11 (Amsterdam, North-Holland, 1979–2003)
2. Lépinoux, J., Mazière, D., Pontikis, V. & Saada, G. (eds) Multiscale Phenomena in Plasticity: From Experiments to Phenomenology, Modelling and Materials Engineering (NATO Science Series Applied Science Vol. 367, Kluwer Academic, Dordrecht, The Netherlands, 2000)
3. Semiconductor Industry Association The National Technology Road Map for Semiconductors at 〈http://public.itrs.net/ 〉 (2002).
4. Alexander, H. & Teichler, H. in Handbook of Semiconductor Technology (eds Jackson, K. A. & Schröter, W.) 293–376 (Wiley-VCH, Berlin, 2000)
5. Hÿtch, M. J. & Plamann, T. Reliable conditions for the measurement of displacement and strain from high resolution electron microscope images. Ultramicroscopy 87, 199–212 (2001)
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