Direct measurement of local lattice distortions in strained layer structures by HREM-Reference-Cited by-同舟云学术

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Direct measurement of local lattice distortions in strained layer structures by HREM

Published:1993-02 Issue:1-4 Volume:49 Page:273-285
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Bierwolf R.,Hohenstein M.,Phillipp F.,Brandt O.,Crook G.E.,Ploog K.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference15 articles.

1. Quantitative chemical lattice imaging: theory and practice

2. The influence of non-linear interference processes on the HREM contrast of AlGaAs in 〈100〉 projection

3. EMS - a software package for electron diffraction analysis and HREM image simulation in materials science

4. Proc. 12th Int. Congr. for Electron Microscopy;Dahmen,1990

5. Hrem of Defects in Silicon at Twin Intersections

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