Study of interfacial random strain fields in core-shell ZnO nanowires by scanning transmission electron microscopy-Reference-Cited by-同舟云学术

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Study of interfacial random strain fields in core-shell ZnO nanowires by scanning transmission electron microscopy

Published:2020-06 Issue: Volume:133 Page:102862
ISSN:0968-4328
Container-title:Micron
language:en
Short-container-title:Micron

Author:

Zhang Yongsen,Zhang Wujun,Sun Yuzhou,Yu Hongchun,Lu Jiangbo,Lin Nan,Wang Zuyong,Pan Nan,Wang Xiaoping,Ma Chao

Funder

National Natural Science Foundation of China

MOST of China

Fundamental Research Funds for the Central Universities

Publisher

Elsevier BV

Subject

Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science

Reference47 articles.

1. Absorptive potentials due to ionization and thermal diffuse scattering by fast electrons in crystals;Allen;Phys. Rev. B,1990

2. Application of convergent beam electron diffraction to two-dimensional strain mapping in silicon devices;Armigliato;Appl. Phys. Lett.,2003

3. Improved precision in strain measurement using nanobeam electron diffraction;Béché;Appl. Phys. Lett.,2009

4. Strain measurement at the nanoscale: comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography;Béché;Ultramicroscopy,2013

5. Surface relaxation of strained Ga(P,As) GaP heterostructures investigated by HAADF STEM;Beyer;J. Microsc.,2017

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