A quick method for the determination of bulk generation lifetime in semiconductors from pulsed MOS capacitance measurements
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. A technique for producing polysilicon patterns with bevelled edge profiles using wet etching
2. On the determination of minority carrier lifetime from the transient response of an MOS capacitor
3. Field-enhanced carrier generation in MOS capacitors
4. Physics and Technology of Semiconductor Devices;Grove,1967
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