Sparse modeling of EELS and EDX spectral imaging data by nonnegative matrix factorization-Reference-Cited by-同舟云学术

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Sparse modeling of EELS and EDX spectral imaging data by nonnegative matrix factorization

Published:2016-11 Issue: Volume:170 Page:43-59
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Shiga Motoki,Tatsumi Kazuyoshi,Muto Shunsuke,Tsuda Koji,Yamamoto Yuta,Mori Toshiyuki,Tanji Takayoshi

Funder

JSPS KAKENHI

Toyota Physical & Chemical Research Institute Scholar

JST CREST

JST ERATO

RIKEN PostK

NIMS MI2I

KAKENHI

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference31 articles.

1. Extracting information from sequences of spatially resolved EELS spectra using multivariate statistical analysis;Bonnet;Ultramicroscopy,1999

2. EELS elemental mapping with unconventional methods I. Theoretical basis: Image analysis with multivariate statistics and entropy concepts;Trebbia;Ultramicroscopy,1990

3. Mapping chemical and bonding information using multivariate analysis of electron energy-loss spectrum images;Bosman;Ultramicroscopy,2006

4. Multivariate statistics applications in phase analysis of STEM-EDS spectrum images;Parish;Ultramicroscopy,2010

5. Statistical consequences of applying a PCA noise filter on EELS spectrum images;Lichtert;Ultramicroscopy,2013

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