Extracting information from sequences of spatially resolved EELS spectra using multivariate statistical analysis
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference28 articles.
1. Electron energy loss spectrometry mapping
2. PEELS compositional profiling and mapping at nanometer spatial resolution
3. Spectrum-Line Profile Analysis of a Magnesium Aluminate Spinel Sapphire Interface
4. Spatially Resolved EELS Fine Structures at a SiO2/TiO2 Interface
5. Improvements in detection sensitivity by spatial difference electron energy-loss spectroscopy at interfaces in ceramics
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