Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference74 articles.
1. Microanalysis by means of electrons;Hillier;J. Appl. Phys.,1944
2. Electron Energy-Loss Spectroscopy in the Electron Microscope;Egerton,2011
3. V.J. Keast, A.J. Scott, R. Brydson, D.B. Williams, J. Bruley, Electron energy-loss near-edge structure – a tool for the investigation of electronic structure on the nanometre scale, Journal of. MicroscopyMicrosc., 203 135–175.
4. Energy-Filtering Transmission Electron Microscopy;Reimer,1995
5. Resolution enhancement by deconvolution using a field emission source in electron energy loss spectroscopy;Batson;Ultramicroscopy,1992
Cited by
22 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献