Towards Atomic-Resolution Electron Energy Loss Spectroscopy in an Uncorrected 30kV Scanning Electron Microscope-Reference-Cited by-同舟云学术

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Towards Atomic-Resolution Electron Energy Loss Spectroscopy in an Uncorrected 30kV Scanning Electron Microscope

Published:2024-07 Issue:Supplement_1 Volume:30 Page:
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Ramasse Quentin¹²,Kepaptsoglou Demie¹³,Sunaoshi Takeshi⁴,Kaji Kazutoshi⁵,Okada Satoshi⁵,Yamazawa Yu⁵,Saito Tsutomu⁵,Dixon Michael⁶,Azough Feridoon⁷,Freer Robert⁷

Affiliation:

1. SuperSTEM Laboratory, SciTech Daresbury Campus , Daresbury , United Kingdom

2. School of Chemical and Process Engineering & School of Physics and Astronomy, University of Leeds , Leeds , United Kingdom

3. School of Physics, Engineering and Technology, University of York , York , United Kingdom

4. Hitachi High-Technologies Corp., Application Development Department , Ibaraki , Japan

5. Hitachi High-Technologies Corp., Electron Microscope Systems Design 1st Dept., Ibaraki , Japan

6. Hitachi High-Tech Europe, SciTech Daresbury Campus , Daresbury , United Kingdom

7. School of Materials, University of Manchester , Manchester , United Kingdom

Publisher

Oxford University Press (OUP)

Link

https://academic.oup.com/mam/article-pdf/30/Supplement_1/ozae044.310/58671657/ozae044.310.pdf

Reference10 articles.

1. Atomic-Resolution Imaging with a Sub-50-pm Electron Probe

2. Twenty years after: How “Aberration correction in the STEM” truly placed a “A synchrotron in a Microscope”

3. Transmission electron microscopy at 20kV for imaging and spectroscopy

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