Plan-view transmission electron microscopy specimen preparation for atomic layer materials using a focused ion beam approach-Reference-Cited by-同舟云学术

Plan-view transmission electron microscopy specimen preparation for atomic layer materials using a focused ion beam approach

Published:2019-02 Issue: Volume:197 Page:95-99
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Lee Lan-Hsuan^ORCID,Yu Chia-Hao,Wei Chuan-Yu,Lee Pei-Chin,Huang Jih-Shang,Wen Cheng-Yen

Funder

Ministry of Science and Technology

Center of Atomic Initiative for New Materials (AI-Mat), National Taiwan University, Taipei, Taiwan

Ministry of Education (MOE)

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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5. Wafer-scale growth of single-crystal monolayer graphene on reusable hydrogen-terminated germanium;Lee;Science,2014

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