Abstract
Abstract
We demonstrate a series of procedures to prepare a clean surface of micro-sized graphite, mined from a bulk flake and securely affixed onto a macroscopic Si plate by focused ion beam scanning electron microscope. Analyses of structure and electronic (chemical) states were made using micro-beam X-ray photoelectron spectroscopy and angle-resolved photoemission spectroscopy. At the surface of the micro graphite, the band dispersion from a single-domain structure was observed. The proposed methodology showcases its capability to produce clean and high-quality micro samples suitable for surface-sensitive analyses. This technique paves the way to investigate surfaces of unexplored microcrystals embedded in complex materials.
Funder
Japan Society for the Promotion of Science
Core Research for Evolutional Science and Technology
Cited by
1 articles.
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