Systematic study of FIB-induced damage for the high-quality TEM sample preparation-Reference-Cited by-同舟云学术

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Systematic study of FIB-induced damage for the high-quality TEM sample preparation

Published:2024-08 Issue: Volume:262 Page:113980
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Uzuhashi Jun^ORCID,Ohkubo Tadakatsu

Publisher

Elsevier BV

Reference34 articles.

1. Transmission Electron Microscopy - A Textbook For Materials Science;Williams,1996

2. Transmission Electron Microscopy - Physics of Image Formation and Microanalysis;Kohl,2008

3. A spherical-aberration-corrected 200kV transmission electron microscope;Haider;Ultramicroscopy,1998

4. Electron microscopy image enhanced;Haider;Nature,1998

5. Towards sub-Å electron beams;Krivanek;Ultramicroscopy,1999

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer;Journal of Applied Physics;2024-08-01

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