Real-time surface composition and roughness analysis in MBE using RHEED-induced X-ray fluorescence
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference8 articles.
1. Chemical Analysis of Surfaces by Total-Reflection-Angle X-Ray Spectroscopy in RHEED Experiments (RHEED-TRAXS)
2. Anomalous X-Ray Yields under Surface Wave Resonance during Reflection High Energy Electron Diffraction and Adatom Site Determination
3. An apparatus for beam-rocking reflection high-energy electron diffraction and total reflection angle x-ray spectroscopy
4. Electron beam induced x-ray emission: An in situ probe for composition determination during molecular beam epitaxy growth
5. High-Resolution X-ray Spectroscopy Close to Room Temperature
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2. In situ compositional mapping of combinatorial materials libraries by scanning low-angle x-ray spectroscopy;Journal of Vacuum Science & Technology A;2021-05
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4. Element-Specific Surface X-Ray Diffraction Study ofGaAs(001)−c(4×4);Physical Review Letters;2006-02-08
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